The white light interferometer forms reference and measurement optical paths using different optical components. When the optical path difference between the two coherent beams changes, it causes highly sensitive shifts in the interference fringes.

An interferometer is based on the phenomenon of wave interference, where two or more overlapping waves produce an interference pattern. The original light intensity is redistributed, resulting in waves with higher, equal, or lower amplitudes.

The ion beam polishing machine utilizes a high-energy ion beam with high current density, low beam divergence, and excellent beam uniformity to bombard the surface of optical components, enabling ultra-precision machining of optical elements.

Thickness measurement instruments primarily use various physical principles to measure coating thickness, including magnetic induction, eddy current, ultrasonic, laser, and optical interference methods.