Hockwell Inspection and Testing

Through precise process control, the coatings are uniform with strong adhesion. Gold plating thickness can exceed 50μm, nickel plating up to 100μm, and infrared reflectivity reaches over 97.5%, meeting high-end market demands.

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ReflectivityReport

Detection methods

Testing was conducted with a Shimadzu UV‑3600i Plus instrument.

Test method: UV‑3600i Plus (with integrating sphere)

Wavelength range: 700–1000 nm; test angle: 8°.

Key inspection points

· Reflectance:The 8° reflectance is 97.166 % over the 700 – 1000 nm wavelength range, and 97.673 % at 1000 nm.

· Film material:Controlling film thickness significantly affects reflectance. In optical device manufacturing, the thickness is precisely controlled so that the film exhibits the desired reflection and transmission characteristics within the visible light range.

· Surface morphology:The surface roughness and flatness of the coating also affect reflectance; surfaces with higher flatness generally exhibit higher reflectance.

· Incident angle:Reflectance is also influenced by the angle of incidence and may vary at different incident angles.

RoughnessReport

Measurement principles and methods

Either contact or non‑contact methods can be used. Contact methods include employing a surface roughness tester, whose built‑in sharp stylus slides over the surface being measured, senses its roughness, converts the displacement signal into an electrical signal, and ultimately outputs a roughness value. Non‑contact methods rely on optical principles—such as laser scattering and white‑light interferometry—assessing roughness by measuring the reflection or scattering characteristics of light on the coating surface.

Measurement parameters

Sa (Arithmetic Mean Height): a surface‑roughness parameter representing the arithmetic average of height deviations across the surface. A smaller Sa value indicates a smoother surface.

Sq (Root Mean Square Height): another common surface‑roughness parameter that represents the root‑mean‑square value of height deviations across the surface. Sq provides a standard‑deviation measure of roughness; a smaller Sq value indicates less variation in surface roughness.

Sz (Maximum Height): the maximum distance from the highest peak to the lowest valley in surface‑roughness measurement. Sz represents an extreme value, reflecting the greatest peak‑to‑valley difference on the surface.

QualityControl

  • · WhiteLightInterferometer

    A white light interferometer forms reference and measurement optical paths using different optical components. When the optical path difference between the two coherent beams changes, it causes highly sensitive shifts in the interference fringes.

    · WhiteLightInterferometer

    A white light interferometer forms reference and measurement optical paths using different optical components. When the optical path difference between the two coherent beams changes, it causes highly sensitive shifts in the interference fringes.

  • · Interferometer

    An interferometer is based on the phenomenon of wave interference, where two or more overlapping waves create an interference pattern. The original light intensity is redistributed, resulting in waves with higher, equal, or lower amplitudes.

    · Interferometer

    An interferometer is based on the phenomenon of wave interference, where two or more overlapping waves create an interference pattern. The original light intensity is redistributed, resulting in waves with higher, equal, or lower amplitudes.

  • · Profilometer

    The ion beam polishing machine uses a high-energy ion beam with high current density, low beam divergence, and excellent beam uniformity to bombard the surface of optical components, enabling high-precision processing.

    · Profilometer

    The ion beam polishing machine uses a high-energy ion beam with high current density, low beam divergence, and excellent beam uniformity to bombard the surface of optical components, enabling high-precision processing.

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